Special Issue on “Machine Learning, Stochastic Modelling and Applied Statistics for EMF Exposure Assessment” [Intl J Env Res Public Health (IF 2.145)]
It is open for contributions the Special Issue “Machine Learning, Stochastic Modelling and Applied Statistics for EMF Exposure Assessment” on the Intl J Env Res Public Health (JCR IF: 2.145).
(Guest Editors: Gabriella Tognola, Emma Chiaramello, Masao Taki, Joe Wiart).
Topics: The Special Issue is open to scientific studies addressing the use of applied statistics, machine learning, and stochastic dosimetry for EMF exposure assessment. It is dedicated to works in any frequency area, from static fields up to exposures in the THz region, dealing with exposure assessment, dosimetry, hazard identification, and characterization, risk assessment.
Keywords: EMF exposure assessment; Machine learning; Stochastic dosimetry; Applied statistics; Environmental health
Deadline for manuscript submission: 29 Feb 2020.
Details here: https://www.mdpi.com/journal/ijerph/special_issues/MLSMAASFEEA